blob: 917fab60f7c31c03599bc397d91ed32e2c2fb606 [file] [log] [blame]
#! /bin/bash
# SPDX-License-Identifier: GPL-2.0
# Copyright (c) 2013 Samsung Electronics. All Rights Reserved.
#
# FS QA Test No. generic/022
#
# Delayed allocation collapse range tests
# This testcase is one of the 4 testcases which tries to
# test various corner cases for fcollapse range functionality over different
# type of extents. These tests are based on generic/255 test case.
# For the type of tests, check the description of _test_generic_punch
# in common/rc.
seq=`basename $0`
seqres=$RESULT_DIR/$seq
echo "QA output created by $seq"
here=`pwd`
tmp=/tmp/$$
status=1 # failure is the default!
_cleanup()
{
rm -f $tmp.*
}
trap "_cleanup ; exit \$status" 0 1 2 3 15
# get standard environment, filters and checks
# we need to include common/punch to get defination fo filter functions
. ./common/rc
. ./common/filter
. ./common/punch
# real QA test starts here
_supported_fs generic
_require_test
_require_xfs_io_command "fpunch"
_require_xfs_io_command "falloc"
_require_xfs_io_command "fiemap"
_require_xfs_io_command "fcollapse"
testfile=$TEST_DIR/$seq.$$
_test_generic_punch -d falloc fpunch fcollapse fiemap _filter_hole_fiemap $testfile
_check_test_fs
status=0
exit